Spadshchina

Technical Profile of 'Spadshchyna' Durum Wheat

The 'Spadshchyna' cultivar, developed by the V.Y. Yuriev Institute of Plant Production (NAAS of Ukraine), is engineered for high-quality grain yields under intensive farming conditions. As a spring durum wheat, it optimizes the trade-off between a short growing season and superior milling characteristics.

Biological and Morphological Specifications

• Vegetation Period: A 90–100 day maturity window allows for effective escape from mid-summer heat stress, a critical factor for durum wheat consistency.
• Plant Structure: Awned variety, reaching a height of 90–100 cm. Given its medium resistance to lodging, precision application of growth regulators during the booting stage is recommended to manage straw strength.
• Stand Density: The cultivar is optimized for a target density of 4.0–4.5 million productive stems per hectare.

Grain Quality and Phytosanitary Resilience

The core commercial advantage of 'Spadshchyna' is its gluten content exceeding 30%. With a 1,000-kernel weight of 40–45 g, the variety offers a stable yield potential of 5–6 tons per hectare. Genetically, the cultivar is highly resistant to brown leaf rust and demonstrates strong suppression capabilities against common pathogens, including loose smut, covered smut, and powdery mildew.

This variety is tailored for agricultural enterprises prioritizing high-quality flour production where gluten protein integrity is paramount. While genetically robust, the cultivar requires a systematic fungicide application program during the early growth stages to ensure the full realization of its yield potential and to prevent late-season infection.